ARAB LAB 2024Products & Services XTrace 2 - The Latest X-Ray Source for Scanning Electron Microscopes

XTrace 2 - The Latest X-Ray Source for Scanning Electron Microscopes

Exhibitor
Bruker Nano Analytics

Micro-X-ray Fluorescence(micro-XRF)spectroscopy is a non-destructive analytical technique that can be used next to Energy Dispersive Spectroscopy(EDS)on a Scanning Electron Microscope(SEM). The X-ray source in QUANTAX micro-XRF analyzes light and heavy elements with high energy X-rays, scans topographic samples with a patented Aperture Management System, accurately analyzes powders via large spot size measurements and automates analysis processes with motorized source insertion and retraction.

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