ARAB LAB 2024German Exhibitors Bruker Nano Analytics

Bruker Nano Analytics

Booth number: 522
www.bruker.com/bna

About us

The Bruker Nano Analytics division (Headquarters Bruker Nano GmbH, Berlin-Germany) develops, manufactures, and markets systems for elemental and structural analysis on the micro and nano scale.

Our unique range of analytical tools for comprehensive compositional and structural material analysis in electron microscopes includes EDS for SEM, EDS for TEM, WDS, EBSD and micro-XRF on SEM.

On top we offer a variety of benchtop micro-X-ray fluorescence (micro-XRF) spectrometers for spatially resolved composition analysis and total reflection X-ray fluorescence (TXRF) instruments for trace element analysis for a multitude of applications.

Our handheld XRF analyzers as well as the mobile/portable countertop XRF analyzer, enabling non-destructive and on-site element analysis complete the portfolio.

Address

Bruker Nano Analytics
Am Studio 2D
12489 Berlin
Germany

E-mail: marketing.bna@bruker.com
Phone:  +49 30 6709900
Internet: www.bruker.com/bna

Contact person:

John Gilbert
Regional Sales Manager Electron Microscope Analyzers Europe, India and Middle East
E-mail: john.gilbert@bruker.com

André Schmuck
Director Sales Handheld XRF, EMEA
E-mail: andre.schmuck@bruker.com

Heath Young
Sales Manager Electron Microscope Analyzers, UK, NORDICS and Middle East
E-mail: heath.young@bruker.com

Andreas Wittkopp
Regional Sales Manager micro-XRF and TXRF, EMEA
E-mail: andreas.wittkopp@bruker.com

XFlash® 7 - The EDS Detector for Scanning Electron Microscopy

Bruker’s latest generation of QUANTAX EDS systems feature the XFlash® 7 detector series, providing the largest solid angle, highest throughput and highest take-off angle for X-ray collection on electron microscopes.

Combined with the modular ESPRIT software, QUANTAX EDS delivers the fastest and most reliable results and guarantees best data quality for your research.

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XTrace 2 - The Latest X-Ray Source for Scanning Electron Microscopes

Micro-X-ray Fluorescence(micro-XRF)spectroscopy is a non-destructive analytical technique that can be used next to Energy Dispersive Spectroscopy(EDS)on a Scanning Electron Microscope(SEM). The X-ray source in QUANTAX micro-XRF analyzes light and heavy elements with high energy X-rays, scans topographic samples with a patented Aperture Management System, accurately analyzes powders via large spot size measurements and automates analysis processes with motorized source insertion and retraction.

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