ARAB LAB 2024Products & Services XFlash® 7 - The EDS Detector for Scanning Electron Microscopy

XFlash® 7 - The EDS Detector for Scanning Electron Microscopy

Exhibitor
Bruker Nano Analytics

Bruker’s latest generation of QUANTAX EDS systems feature the XFlash® 7 detector series, providing the largest solid angle, highest throughput and highest take-off angle for X-ray collection on electron microscopes.

Combined with the modular ESPRIT software, QUANTAX EDS delivers the fastest and most reliable results and guarantees best data quality for your research.

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