ARAB LAB 2023Products & Services XFlash® 7 - The EDS Detector for Scanning Electron Microscopy
XFlash® 7 - The EDS Detector for Scanning Electron Microscopy
Exhibitor
Bruker Nano Analytics
Bruker’s latest generation of QUANTAX EDS systems feature the XFlash® 7 detector series, providing the largest solid angle, highest throughput and highest take-off angle for X-ray collection on electron microscopes.
Combined with the modular ESPRIT software, QUANTAX EDS delivers the fastest and most reliable results and guarantees best data quality for your research.
Further reading Combined with the modular ESPRIT software, QUANTAX EDS delivers the fastest and most reliable results and guarantees best data quality for your research.
Elemental Analysis: XFlash® 7 - The EDS Detector for SEM, TEM, STEM and T-SEM