Bruker Nano Analytics
Booth number: 522
www.bruker.com/nano-analytics
About us
The Bruker Nano Analytics division (Headquarters Bruker Nano GmbH, Berlin-Germany) develops, manufactures, and markets systems for elemental and structural analysis on the micro and nano scale.
Our unique range of analytical tools for comprehensive compositional and structural material analysis in electron microscopes includes EDS for SEM, EDS for TEM, WDS, EBSD and micro-XRF on SEM.
On top we offer a variety of benchtop micro-X-ray fluorescence (micro-XRF) spectrometers for spatially resolved composition analysis and total reflection X-ray fluorescence (TXRF) instruments for trace element analysis for a multitude of applications.
Our handheld XRF analyzers as well as the mobile/portable countertop XRF analyzer, enabling non-destructive and on-site element analysis complete the portfolio.
Address
Am Studio 2D
12489 Berlin
Germany
Phone: +49 30 6709900
Contact person:
John Gilbert
Regional Sales Manager – Europe India Middle East
E-mail: John.Gilbert@bruker.com
Phone: +44 791 7304235
André Schmuck
Director Sales EMEA, HMP
E-mail: Andre.Schmuck@bruker.com
Phone: +49 2841 3675475
Products & Services
Our unique range of analytical tools for comprehensive compositional and structural material analysis in electron microscopes includes EDS for SEM, EDS for TEM, WDS, EBSD and micro-XRF on SEM.
On top we offer a variety of benchtop micro-X-ray fluorescence (micro-XRF) spectrometers for spatially resolved composition analysis and total reflection X-ray fluorescence (TXRF) instruments for trace element analysis for a multitude of applications.
Our handheld XRF analyzers as well as the mobile/portable countertop XRF analyzer, enabling non-destructive and on-site element analysis complete the portfolio.
XFlash® 7 - The EDS Detector for Scanning Electron Microscopy
Combined with the modular ESPRIT software, QUANTAX EDS delivers the fastest and most reliable results and guarantees best data quality for your research.
