Oxford Instruments GmbH
Booth number: 517
www.oxinst.com/
About us
Oxford Instruments is a leading company in the field of high-tech instruments and systems for research and industry. Since our foundation in 1959, we have specialised in the design, manufacture and support of various scientific instruments and solutions used in diverse fields such as materials science, nanotechnology and industrial applications. Oxford Instruments plays an important role in advancing scientific knowledge and technological progress with its state-of-the-art instruments and solutions. Our aim is to enable a greener, healthier and more connected advanced society.
We are proud to be recognised as the leaders in what we do and for the difference we make in the world.
Address
Borsigstraße 15a
65205 Wiesbaden
Germany
E-mail: emea.marketing@oxinst.com
Phone: +49 6122 9370
Internet: www.oxinst.com/
Contact person:
Anica Bickem
EMEA Marketing
E-mail: emea.marketing@oxinst.com
Products & Services
Atomic Force Microscopy
Nuclear Magnetic Resonance
Nano Analysis with Electron Microscopy
Raman Spectroscopy
Hydra - Nano Analysis
Oxford Instruments provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.
Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.
-thumb.webp)
X-Pulse - Nuclear Magnetic Resonance
Oxford Instruments Magnetic Resonance benchtop NMR spectroscopy and time domain (TD-NMR) relaxometry solutions enable novel research and optimise quality control.
RISE - Raman Spectroscopy
RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
The RISE Microscope combines all features of a stand-alone SEM and the confocal Raman imaging microscope alpha300 within one instrument.
Vero - Atomic Force Microscopy
The Vero atomic force microscope is a next-generation AFM that precisely and accurately measures true tip displacement using Quadrature Phase Differential Interferometry (QPDI). Built on the unrivaled stability and performance of the Cypher AFM family, this unique patented QPDI innovation enables Vero to provide AFM results with higher accuracy, precision, and repeatability.
