About us

Bruker Nano offers solutions for all your nanoscience
needs.

Bruker Nano Analytics develops, manufactures and markets systems for the investigation of the composition and structure of materials on the micro and nano scale. This includes EDS, EBSD, WDS and Micro-XRF for scanning electron microscopes.  

The M-series for micro X-ray fluorescence spectrometry as well as handheld and small, light-weight counter top X-ray fluorescence (XRF) analyzers enable non-destructive element analysis.

Our total reflection X-ray fluorescence (TXRF) spectrometers add to our range of nano analysis solutions.

Bruker Nano Surfaces offers 3D metrology and inspection systems including atomic force microscopes, optical/stylus profilers and mechanical and tribological tools with unmatched capabilities.

Products and services

Bruker Nano Analytic’s electron microscope analyzers QUANTAX EDS, QUANTAX WDS, QUANTAX EBSD and QUANTAX Micro-XRF on SEM provide unmatched comprehensive compositional and structural materials analysis.

The M-series for micro X-ray fluorescence spectrometry (Micro-XRF) as well as the handheld X-ray fluorescence (XRF) analyzers TITAN and TRACER and the CTX CounterTop XRF enable non-destructive element analysis.

Our total reflection X-ray fluorescence (TXRF) spectrometers add to our range of nano analysis solutions.
Bruker Nano Surfaces offers 3D metrology and inspection systems including atomic force microscopes, optical/stylus profilers and mechanical and tribological tools with unmatched capabilities.

Electron Microscope and Micro-XRF Analyzers

Bruker Nano offers solutions for all your nanoscienc needs.
Bruker Nano Analytic’s electron microscope analyzers QUANTAX EDS, QUANTAX WDS, QUANTAX EBSD and QUANTAX Micro-XRF on SEM
provide unmatched comprehensive compositional and structural materials analysis.
The M-series for micro X-ray fluorescence spectrometry (Micro-XRF) enables non-destructive element analysis. Our total reflection X-ray fluorescence (TXRF) spectrometers add to our range of nano analysis solutions.

Further reading

Dimension FastScan AFM

Bruker Nano offers solutions for all your nanoscience needs.
Bruker Nano Surfaces offers 3D metrology and inspection systems including atomic force microscopes, optical/stylus profilers and mechanical and tribological tools with unmatched capabilities.

Further reading

CTX CounterTop XRF

The portable Counter Top XRF (CTX) is small, light-weight, safety-interlocked, and battery operated. At less than 7 kilograms in weight, the self-contained CTX is truly portable, and has a small footprint of 14 cm in width.
The CTX is available in several configurations optimized for different industries and applications, such as:
• Minerals and mining
• Food safety and agriculture
• Pharmaceutical raw materials
• Precious metals
• Polymers
• Marine fuel oil analysis (MARPOL)

Further reading

Address
Bruker Nano GmbH
Am Studio 2D
12489 Berlin
Germany

Phone: +49 30 670990-0
Internet: www.bruker.com
E-mail: Send message

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