The thickness of the non-alloyed and alloyed tin layer on thin copper wires can be measured with high accuracy in a short duration by this electrochemical analyzer SnLayer.
The coulometric determination of the thickness of the tin layer at the copper wires based on the newly developed multiple potential-ramp procedure.
The total amount of tin as well as the non-alloyed and the alloyed tin-part is detectable in only one measurement.
The SnLayer can be used for determination of thickness of tin at copper wires, strands and conductors in galvanic plating process.
Exhibitor: ECH Elektrochemie Halle GmbH